Abstract
The effect of in-plane magnetic field on switching voltage (Vsw) and thermal stability factor (Δ) are investigated in electric-field-controlled perpendicular magnetic tunnel junctions (p-MTJs). Dwell time measurements are used to determine the voltage dependence of the energy barrier height for various in-plane magnetic fields (Hin), and gain insight into the Hin dependent energy landscape. We find that both Vsw and Δ decrease with increasing Hin, with a dominant linear dependence. The results are reproduced by calculations based on a macrospin model while accounting for the modified magnetization configuration in the presence of an external magnetic field.
In practical situations however, an in-plane magnetic field (e.g. applied externally or provided by an in-plane fixed layer) is needed to ensure a single in-plane precessional axis,9–11 and hence modifies the energy landscape and switching behavior. The modification of the energy landscape affects the relevant parameters of the MTJs, including: (1) the thermal stability (Δ = Eb/kBT, where Eb denotes the energy barrier that separates the two magnetization states, kB is the Boltzmann constant, and T is the temperature), which characterizes the ability of the magnetization states to remain stable against thermal fluctuations, (2) the switching voltage (Vsw), which corresponds to the voltage required to switch between the two magnetization configurations, and (3) the switching time, equal to half the precession period. Recently, the effect of in-plane magnetic field on the period of the magnetization precession was studied in p-MTJs.12,13 In this Letter, we investigate the dependence of thermal stability and switching voltage on in-plane magnetic fields (Hin). We first provide a method for measuring the voltage-dependent energy barrier height Eb(V ), and gain insight into the energy landscape. We then apply the above method combined with switching experiments to reveal the effect of in-plane magnetic fields on the energy landscape and related MTJs parameters. Our results indicate that both Δ and Vsw decrease with the increase of Hin, with a dominant linear dependence. These observations are accurately reproduced by calculations of the energy landscape based on a macrospin model.

FIG. 1. (a) Schematic of the device structure and measurement configuration. An external magnetic field (H) is applied at a tilted angle of θH from the film normal. Hoop (Hin) denotes the out-of-plane (in-plane) component of H. (b) Tunnel magnetoresistance versus Hoop measured under +10 mV for θH = 0°, 11°, and 26°. The dashed line indicates the out-of-plane offset field (μ0Hs = − 142 mT) that compensates the stray field from the fixed layers.

FIG. 2. Dwell time measurement results for θH = 0° (μ0Hin = 0 mT). (a) Real-time voltage measured at the scope for +1 V dc bias across the MTJ and μ0Hoop = μ0Hs. The device is incorporated into a voltage divider circuit. (b) Distribution for P state dwell times for +1 V dc bias and μ0Hoop = − 143.9 mT, fitted by an exponential envelope corresponding to a Poissonian distribution. (c) Tunnel magnetoresistance (referenced to the right axis) and dwell times (referenced to the left axis) from P to AP (blue) and AP to P (red) versus Hoop under +1 V dc bias. The fits (solid lines) using Eq. (1) yields a retention time τ = 13.9 s, corresponding to an energy barrier height Eb = 23.3 kBT. (d) Energy barrier Eb as a function of the dc bias voltage, yielding Δ = 34.6 and ξ = 30.5 fJV−1m−1 (red line is a fit to Eq. (3)). The inset shows the comparison between ξ fitted to Eq. (3) using the nominal junction area A (blue) and the sub-volume area A∗ (red) for various junction size. The fit using A∗ is in good agreement with ξ as determined by switching experiments (green), confirming the validity of the model both in the single-domain (blue) and nucleation reversal regimes (purple).

FIG. 3. (a) Voltage dependence of the energy barrier height for various applied in-plane magnetic field. Solid lines correspond to linear fits. (b) Corresponding (dots) Eb,0 and ξ as a function of Hin. The red dashed-dotted line is the result of calculations using Eq. (5).

FIG. 4. (a) Measured switching probabilities of back and forth magnetization switching (P01P10) by two successive 1.9 V voltage pulses as functions of pulse duration for various external magnetic field angle θH, and μ0Hoop = [ − 150, − 135] mT. Corresponding in-plane component of external magnetic field is shown on the top axis. (b) Measured V sw as a function of Hin. The red dashed-dotted line is the results of simulations using Eq. (4), rescaled to account for the difference of definition between the measured V sw and simulated V c.

FIG. 5. (a) Calculated energy landscape (in unit of KBT) as a function of the magnetization angle θ and magnitude of the in-plane magnetic field. The white dashed-lines indicate the energy minima. The zero-voltage perpendicular anisotropy field μ0Hk,eff,0 is shown as a black dashed-line. (b) Calculated voltage dependence of the energy barrier height for various Hin.
A schematic of the MTJ and measurement configuration used in this study is shown in Figure 1(a). The stack structure consists of a bottom 1.1 nm (t) thick Co20Fe60B20 free layer, a 1.4 nm (td) thick MgO barrier layer, and top 1.4 nm thick Co20Fe60B20 reference layer with a synthetic antiferromagnetic pinning layer. This is the same structure as that used in Ref. 11. The film is processed into a circular MTJ of 50 nm (d) in junction diameter by using electron-beam lithography and dry etching techniques. Both CoFeB layers have perpendicular easy axes, and the magnetization direction of the CoFeB reference layer is fixed to the +z direction. A tilted external magnetic field (H) is applied with an angle θH from the film normal. The out-of-plane (Hoop) and in-plane (Hin) components of H correspond to HcosθH and HsinθH, respectively.
Figure 1(b) shows measurements of resistance R as a function of the out-of-plane component of the magnetic field Hoop under +10 mV dc bias for θH = 0°, 11°, and 26°. The junction resistance-area product is 650 Ω.μm2, and the tunnel magnetoresistance ratio, defined as at θH = 0°, is 49%, where RP and RAP are the resistances at parallel (P) and antiparallel (AP) magnetization configurations, respectively. Increasing Hin is observed to decrease the coercivity of the free layer along the perpendicular axis, in agreement with previous studies in similar structures.12,13 The hysteresis curves are shifted at negative Hoop, due to stray fields from the fixed (i.e combined pinning and reference) layers acting on the CoFeB free layer. The shift is found to be independent of θH, which indicates that the directions of magnetization in the fixed layers are not tilted from the sample normal during the experiment. Hereafter, we present and compare results for various Hin, where the out-of-plane component of H is maintained near μ0Hoop = μ0Hs = − 142 mT, to compensate the stray field. Values of Eb and Vsw are determined from μ0Hoop strictly fixed to μ0Hs.
Energy barrier heights (Eb) are obtained by measuring the mean time for thermally activated switching (dwell time) under different applied magnetic fields. 14 The mean value at a particular magnetic field is determined from a total of 102 switching events, which are monitored by measuring the real-time voltage across the MTJ (Figure 2(a)–2(b)). The dwell times from P to AP (τ+) and AP to P (τ−) are then fitted using the Neel-Brown formula,15
where τ0 is the inverse of the attempt frequency (assumed to be 1 ns), and Hk,eff is the effective magnetic anisotropy field. In the following, we restrict our measurements to Eb > 15kBT to remain in the regime of high energy barriers (Eb ≫ kBT) in which Eq. (1) is valid.16 Figure 2(c) shows a typical result of dwell time measurements for μ0Hin = 0 mT under +1V dc bias. The measured dwell times are well fitted by Eq. (1), showing a symmetric behavior with respect to Hs. At μ0Hoop = μ0Hs, the relaxation times for the two states are equal , and the energy barrier height Eb = 23.3 kBT can be read directly at the intersection of the fits.
| (1) |
First, we focus on the voltage dependence of Eb in the absence of in-plane magnetic field. As shown in Figure 2(d), the energy barrier decreases linearly with positive voltage. This indicates a modulation of the perpendicular magnetic anisotropy by the applied voltage. The magnetic energy density S per unit volume is given by the sum of the densities of the Zeeman energy, demagnetizing energy, and magnetic anisotropy energy as
where μ0 is the permeability of vacuum, Ms is the free layer saturation magnetization, K is the first-order perpendicular magnetic anisotropy energy constant, and θ is the magnetization angle measured from the sample normal. We introduce the effective magnetic anisotropy energy , which corresponds to the difference in the magnetic energy densities between θ = 0° and θ = 90° at zero magnetic field. Note that, a more detailed analysis should also include the second-order magnetic anisotropy term K2sin4θ. We neglect this in the following and find that this assumption adequately captures our experimental results, consistent with the recent experiments in CoFeB/MgO MTJs showing that K2 is several time smaller than K.17,18 The energy barrier Eb can be calculated from Eq. (2) as the product of the difference between the maximum and minimum energy densities Δ S and the volume of the free layer V* = A*t (=tπ(d/2)2 in the single domain case). In the absence of in-plane magnetic field, the maximum and minimum energy density for a perpendicular MTJ coincide with the hard (θ = 90°) and easy (θ = 0°) anisotropy axis, respectively, yielding Eb(Hin = 0) = KeffV*. Assuming a linear dependence of the first-order anisotropy energy on voltage,19,20 one can write K as (where Ki is the interfacial anisotropy energy density and ξ is the linear VCMA magnetoelectric coefficient) and express the voltage-dependent energy barrier (in the absence of in-plane magnetic field) as
where is the standby thermal stability of the device. The fit to Eq. (3) yields Δ = 34.6 and ξ = 30.5 fJV−1m−1, with Ki = 0.24 mJm−2 and Ms = 0.616 T (corresponding to a zero-voltage perpendicular anisotropy field mT). Note that these values of Ki, Ms, μ0Hk,eff,0 and ξ should be taken as lower limits, since sub-volume nucleation may exist in the CoFeB free layer,21–23 and hence an overestimated free layer area A* would serve to lower the apparent values (see inset). Noteworthy, in the absence of in-plane field, the critical voltage Vc, defined as the voltage required to reduce the energy barrier to zero (Eb(Vc) = 0), can be estimated straightforwardly by linear extrapolation of the measured voltage-dependent energy barrier height, yielding Vc = 3.32 V.
| (2) |
| (3) |
Figure 3(a) shows the voltage dependence of the energy barrier height for various in-plane magnetic fields Hin. It is observed that Eb decreases (increases) linearly with increasing positive (negative) voltage, with a slope independent of Hin in the investigated region (Eb > 15kBT). This behavior can be explained by considering again Eq. (2). For non-zero in-plane magnetic field, the two stable magnetizations states are no longer along the easy anisotropy axis (θ = 0°), but tilted from the sample normal with an angle θ3 = sin−1(Hin/Hk,eff) and θ4 = π − sin−1(Hin/Hk,eff) (fixed by the energy minimum conditions, ∂S/m∂θ = 0 and ∂2S/∂2θ > 0). The voltage-dependent energy barrier height (with θ1.2 = ± 90°, along the hard anisotropy axis) becomes
with a third term that results in nonlinearity both as a function of V and Hin. This non-linear term however is negligible when , conditions that reduce to Hin ≪ Hk,eff. In the experimental data shown in Figure 3, the condition Hin ≪ Hk,eff is always satisfied since we restrict our measurements to the regime where Eb > 15kBT (as also shown below in Figure 5). The corresponding zero-voltage energy barrier height Eb,0 and VCMA coefficient ξ as a function of Hin are shown in Figure 3(b). It is observed that Eb,0 decreases almost linearly with Hin, a result well described by Eq. (4) for zero-voltage
using the same values of Eb,s, Ms and V* as in Eq. (3) (dashed-dotted line). This indicates that the nonlinearity in Hin arising from the third term in Eq. (5) is small, as expected for μ0Hin ≤ 102 mT ≪μ0Hk,eff,0. We note that Eq. (5) is independent of the switching mechanism used during writing, hence the above conclusions extend straightforwardly to field-driven and spin-transfer torque driven pMTJs. The VCMA coefficient, extracted from the slope as , is found to be constant at 30 fJV−1m−1,confirming that the condition of negligible nonlinearity Hin ≪ Hk,eff is also satisfied for non-zero voltage.
| (4) |
| (5) |
We focus now on the in-plane magnetic field dependence of the switching voltage. One can see in Figure 3(a) that the voltage at which the energy barrier is reduced to zero decreases with increasing Hin. In order to estimate this threshold, we performed electric-field induced switching measurements using voltage pulses of various lengths (tpulse) and amplitudes (Vpulse) applied to the device. The measurement setup and procedure are identical to the ones of our previous study (Ref. 11), and the switching probability precision is 0.05. Figure 4(a) shows the measured back and forth magnetization switching (P01P10) by two successive 1.9 V voltage pulses, as functions of pulse duration and out-of-plane (in-plane) component of the external magnetic field. The quantity P01P10 corresponds to the product of the probabilities of P to AP transition (P10) and AP to P transition (P01). An oscillatory dependence of the switching probability on the pulse duration is observed for the range of Hin investigated, which is a signature of the voltage-induced precessional motion of the magnetization. The period of the oscillations is seen to decreases with the increase of Hin magnitude. This indicates a reduction of the Larmor frequency with Hin, in good agreement with previous studies in similar voltage-controlled MTJs. 12,13 The switching voltage is obtained by measuring the contrast of the first oscillation as a function of the pulse amplitude. To allow a comparison with the simulations, we introduce the threshold (switching) voltage Vsw at which the contrast exceed 50% (P01P10 > 0.25), the maximum switching errors induced by thermal fluctuations. Note that this definition does not necessarily correspond to the precessional critical voltage Vc as defined by Eb(Vc) = 0 since switching can occur also below Vc by thermal activation across the energy barrier during voltage pulse applications.24 The measured Vsw for μ0Hin = 69, 82, 92 and 102 mT is shown in Figure 4(b). Its dependence on Hin is well reproduced by the simulations of Vc, obtained by resolving numerically the equation Eb(Vc) = 0, where Eb is given by Eq. (4).
In order to gain insight into the observed experimental characteristics, we show in Figure 5 the results of the calculations with our experimental parameters. The energy landscape in Figure 5(a) is obtained by calculating the magnetic energy SV* of the CoFeB free layer from Eq. (2) for a set of magnetization angles θ and in-plane fields Hin. The stable magnetization states are observed to be shifted towards the hard anisotropy axis (θ = 90°) with increasing Hin (white dashed-lines). For Hin > Hk,eff,0, the easy axis is aligned with the direction of Hin (fully in-plane). Figure 5(b) shows the voltage dependence of the energy barrier height for various Hin values as determined from Eq. (4). The macrospin model reproduces quantitatively our experimental results shown in Figure 3(a). The remaining small discrepancy could be attributed to the effect of the second-order anisotropy and nonuniformity of the magnetization profile. Further study is needed to precisely understand the contributions of the higher order anisotropy in canted magnetization states and develop improved VCMA-based MTJs. 25
In conclusion, we have investigated the dependence of switching voltage and thermal stability on in-plane magnetic field in electric-field-controlled CoFeB/MgO perpendicular magnetic tunnel junctions. Both switching voltage and thermal stability factor decrease with the increase of in-plane magnetic field, with a behavior dominated by a linear dependence for Hin ≪ Hk,eff,0. These results are accurately reproduced by calculations based on a macrospin model, which indicates a tuning with Hin of the stable magnetization states towards the hard anisotropy axis.
This work was partially supported by the National Science Foundation Nanosystems Engineering Research Center for Translational Applications of Nanoscale Multiferroic Systems (TANMS). The work at Inston Inc. was supported in part by a Phase II NSF Small Business Innovation Research award. We would also like to acknowledge the collaboration of this research with King Abdul-Aziz City for Science and Technology (KACST) via The Center of Excellence for Green Nanotechnologies (CEGN). The authors would like to thank the members of the UCLA Device Research Laboratory, TANMS, CEGN and Inston Inc. for fruitful discussions.
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