Abstract
An advanced scanning magnetoresistive microscopy (SMRM) — a robust magnetic imaging and probing technique — will be presented, which utilizes state-of-the-art recording heads of a hard disk drive as sensors. The spatial resolution of modern tunneling magnetoresistive sensors is nowadays comparable to the more commonly used magnetic force microscopes. Important advantages of SMRM are the ability to detect pure magnetic signals directly proportional to the out-of-plane magnetic stray field, negligible sensor stray fields, and the ability to apply local bipolar magnetic field pulses up to 10 kOe with bandwidths from DC up to 1 GHz. Moreover, the SMRM can be further equipped with a heating stage and external magnetic field units. The performance of this method and corresponding best practices are demonstrated by presenting various examples, including a temperature dependent recording study on hard magnetic L10 FeCuPt thin films, imaging of magnetic vortex states in an in-plane magnetic field, and their controlled manipulation by applying local field pulses.
Acknowledgments
This work was partially financed by the German Research Foundation (DFG) in the frame of the International Research Training Group GRK1215 “Materials and Concepts for Advanced Interconnects and Nanosystems”. The authors would like to thank D. Nissen and M. Lindorf (University of Augsburg, Germany) for sample preparation and SEM measurements, D. Karnaushenko (IFW Dresden, Germany) and M. Weinl (University of Augsburg, Germany) for valuable discussions, and R. Bergshoef (FenS, Netherlands) for providing lubricant.
REFERENCES
- 1. Scanning Probe Microscopy in Nanoscience and Nanotechnology, edited by B. Bhushan (Springer, Berlin, Heidelberg, 2010). Google ScholarCrossref
- 2. R. Wiesendanger, Rev. Mod. Phys. 81, 1495 (2009). https://doi.org/10.1103/RevModPhys.81.1495, Google ScholarCrossref
- 3. R. B. Dinner, M. R. Beasley, and K. A. Moler, Rev. Sci. Instrum. 76, 103702 (2005). https://doi.org/10.1063/1.2072438, Google ScholarScitation, ISI
- 4. T. Nishio, V. H. Dao, Q. Chen, L. F. Chibotaru, K. Kadowaki, and V. V. Moshchalkov, Phys. Rev. B 81, 020506 (2010). https://doi.org/10.1103/PhysRevB.81.020506, Google ScholarCrossref
- 5. R. Schirhagl, K. Chang, M. Loretz, and C. L. Degen, Annu. Rev. Phys. Chem. 65, 83 (2014). https://doi.org/10.1146/annurev-physchem-040513-103659, Google ScholarCrossref
- 6. Y. Martin and H. K. Wickramasinghe, Appl. Phys. Lett. 50, 1455 (1987). https://doi.org/10.1063/1.97800, Google ScholarScitation, ISI
- 7. B. Torre, G. Bertoni, D. Fragouli, A. Falqui, M. Salerno, A. Diaspro, R. Cingolani, and A. Athanassiou, Sci. Rep. 1, 202 (2011). https://doi.org/10.1038/srep00202, Google ScholarCrossref
- 8. C. F. Reiche, S. Vock, V. Neu, L. Schultz, B. Büchner, and T. Mühl, New J. Phys. 17, 013014 (2015). https://doi.org/10.1088/1367-2630/17/1/013014, Google ScholarCrossref
- 9. Y. Lisunova, J. Heidler, I. Levkivskyi, I. Gaponenko, A. Weber, C. Caillier, L. J. Heyderman, M. Kläui, and P. Paruch, Nanotechnology 24, 105705 (2013). https://doi.org/10.1088/0957-4484/24/10/105705, Google ScholarCrossref
- 10. H. J. Mamin, D. Rugar, J. E. Stern, R. E. Fontana, and P. Kasiraj, Appl. Phys. Lett. 55, 318 (1989). https://doi.org/10.1063/1.101898, Google ScholarScitation
- 11. W. Rave, L. Belliard, M. Labrune, A. Thiaville, and J. Miltat, IEEE Trans. Magn. 30, 4473 (1994). https://doi.org/10.1109/20.334124, Google ScholarCrossref
- 12. I. D. Mayergoyz, C. Serpico, C. Krafft, and C. Tse, J. Appl. Phys. 87, 6824 (2000). https://doi.org/10.1063/1.372854, Google ScholarScitation
- 13. I. D. Mayergoyz, C. Tse, C. Krafft, and R. D. Gomez, J. Appl. Phys. 89, 6772 (2001). https://doi.org/10.1063/1.1359233, Google ScholarScitation
- 14. S. Yamamoto, D. C. Vier, and S. Schultz, IEEE Trans. Magn. 32, 3410 (1996). https://doi.org/10.1109/20.538640, Google ScholarCrossref
- 15. A. Moser, D. Weller, M. E. Best, and M. F. Doerner, J. Appl. Phys. 85, 5018 (1999). https://doi.org/10.1063/1.370077, Google ScholarScitation
- 16. M. Todorovic, S. Schultz, J. Wong, and A. Scherer, Appl. Phys. Lett. 74, 2516 (1999). https://doi.org/10.1063/1.123885, Google ScholarScitation, ISI
- 17. S. Y. Yamamoto, S. Schultz, Y. Zhang, and H. N. Bertram, IEEE Trans. Magn. 33, 891 (1997). https://doi.org/10.1109/20.560127, Google ScholarCrossref
- 18. S. Y. Yamamoto and S. Schultz, J. Appl. Phys. 81, 4696 (1997). https://doi.org/10.1063/1.365530, Google ScholarScitation
- 19. M. Barbic, S. Schultz, J. Wong, and A. Scherer, IEEE Trans. Magn. 37, 1657 (2001). https://doi.org/10.1109/20.950929, Google ScholarCrossref
- 20. M. Albrecht, A. Moser, C. T. Rettner, S. Anders, T. Thomson, and B. D. Terris, Appl. Phys. Lett. 80, 3409 (2002). https://doi.org/10.1063/1.1476062, Google ScholarScitation
- 21. M. Albrecht, C. T. Rettner, A. Moser, and B. D. Terris, Microsyst. Technol. 13, 129 (2006). https://doi.org/10.1007/s00542-006-0139-6, Google ScholarCrossref
- 22. C. T. Rettner, S. Anders, T. Thomson, M. Albrecht, Y. Ikeda, M. E. Best, and B. D. Terris, IEEE Trans. Magn. 38, 1725 (2002). https://doi.org/10.1109/TMAG.2002.1017763, Google ScholarCrossref
- 23. Y. Zhou, J.-G. Zhu, Y.-S. Tang, and L. Guan, J. Appl. Phys. 97, 10N903 (2005). https://doi.org/10.1063/1.1853893, Google ScholarScitation
- 24. M. Grobis, C. Schulze, M. Faustini, D. Grosso, O. Hellwig, D. Makarov, and M. Albrecht, Appl. Phys. Lett. 98, 192504 (2011). https://doi.org/10.1063/1.3587635, Google ScholarScitation
- 25. M. K. Grobis, O. Hellwig, T. Hauet, E. Dobisz, and T. R. Albrecht, IEEE Trans. Magn. 47, 6 (2011). https://doi.org/10.1109/TMAG.2010.2076798, Google ScholarCrossref
- 26. D. K. Petrov, A. Gupta, J. R. Kirtley, L. Krusin-Elbaum, and H. S. Gill, J. Appl. Phys. 83, 7061 (1998). https://doi.org/10.1063/1.367640, Google ScholarScitation
- 27. X. Liu, D. Mazumdar, B. D. Schrag, W. Shen, and G. Xiao, Phys. Rev. B 70, 014407 (2004). https://doi.org/10.1103/PhysRevB.70.014407, Google ScholarCrossref
- 28. P. Czoschke, S. Kaka, N. J. Gokemeijer, and S. Franzen, Appl. Phys. Lett. 97, 242504 (2010). https://doi.org/10.1063/1.3525927, Google ScholarScitation
- 29. S. H. Leong, M. J. B. Lim, B. Santoso, C. L. Ong, Z.-M. Yuan, Y. J. Chen, T. L. Huang, and S. B. Hu, IEEE Trans. Magn. 47, 1981 (2011). https://doi.org/10.1109/TMAG.2011.2125783, Google ScholarCrossref
- 30. D. Z. Bai, K. Stoev, and F. Liu, IEEE Trans. Magn. 42, 473 (2006). https://doi.org/10.1109/TMAG.2005.862758, Google ScholarCrossref
- 31. D. Weller, O. Mosendz, G. Parker, S. Pisana, and T. S. Santos, Phys. Status Solidi 210, 1245 (2013). https://doi.org/10.1002/pssa.201329106, Google ScholarCrossref
- 32. A. Q. Wu, Y. Kubota, T. Klemmer, T. Rausch, C. Peng, Y. Peng, D. Karns, X. Zhu, Y. Ding, E. K. C. Chang, Y. Zhao, H. Zhou, K. Gao, J.-U. Thiele, M. Seigler, G. Ju, and E. Gage, IEEE Trans. Magn. 49, 779 (2013). https://doi.org/10.1109/TMAG.2012.2219513, Google ScholarCrossref
- 33. D. Weller, G. Parker, O. Mosendz, E. Champion, B. Stipe, X. Wang, T. Klemmer, G. Ju, and A. Ajan, IEEE Trans. Magn. 50, 1 (2014). https://doi.org/10.1109/tmag.2013.2281027, Google ScholarCrossref
- 34. C. Brombacher, H. Schletter, M. Daniel, P. Matthes, N. Jöhrmann, M. Maret, D. Makarov, M. Hietschold, and M. Albrecht, J. Appl. Phys. 112, 073912 (2012). https://doi.org/10.1063/1.4757038, Google ScholarScitation, ISI
- 35. R. P. Cowburn, D. K. Koltsov, A. O. Adeyeye, M. E. Welland, and D. M. Tricker, Phys. Rev. Lett. 83, 1042 (1999). https://doi.org/10.1103/PhysRevLett.83.1042, Google ScholarCrossref
- 36. T. Shinjo, T. Okuno, R. Hassdorf, K. Schigeto, and T. Ono, Science 289, 930 (2000). https://doi.org/10.1126/science.289.5481.930, Google ScholarCrossref
- 37. A. Wachowiak, J. Wiebe, M. Bode, O. Pietzsch, M. Morgenstern, and R. Wiesendanger, Science 298, 577 (2002). https://doi.org/10.1126/science.1075302, Google ScholarCrossref
- 38. R. Micheletto, H. Fukuda, and M. Ohtsu, Langmuir 11, 3333 (1995). https://doi.org/10.1021/la00009a012, Google ScholarCrossref
- 39. R. Streubel, L. Han, M.-Y. Im, F. Kronast, U. K. Rößler, F. Radu, R. Abrudan, G. Lin, O. G. Schmidt, P. Fischer, and D. Makarov, Sci. Rep. 5, 8787 (2015). https://doi.org/10.1038/srep08787, Google ScholarCrossref
- 40. S. Thomas, D. Nissen, and M. Albrecht, Appl. Phys. Lett. 105, 022405 (2014). https://doi.org/10.1063/1.4890380, Google ScholarScitation
- 41. R. Streubel, V. P. Kravchuk, D. D. Sheka, D. Makarov, F. Kronast, O. G. Schmidt, and Y. Gaididei, Appl. Phys. Lett. 101, 132419 (2012). https://doi.org/10.1063/1.4756708, Google ScholarScitation, ISI
- 42. R. Streubel, D. Makarov, F. Kronast, V. Kravchuk, M. Albrecht, and O. G. Schmidt, Phys. Rev. B 85, 174429 (2012). https://doi.org/10.1103/PhysRevB.85.174429, Google ScholarCrossref
- 43. D. Nissen, D. Mitin, O. Klein, S. S. P. K. Arekapudi, S. Thomas, M.-Y. Im, P. Fischer, and M. Albrecht, Nanotechnology 26, 465706 (2015). https://doi.org/10.1088/0957-4484/26/46/465706, Google ScholarCrossref
- 44. D. Mitin, D. Nissen, P. Schädlich, S. S. P. K. Arekapudi, and M. Albrecht, J. Appl. Phys. 115, 063906 (2014). https://doi.org/10.1063/1.4865746, Google ScholarScitation
- 45. R. Rückriem, T. Schrefl, and M. Albrecht, Appl. Phys. Lett. 104, 052414 (2014). https://doi.org/10.1063/1.4864275, Google ScholarScitation
- 46. M. Jaafar, R. Yanes, D. Perez de Lara, O. Chubykalo-Fesenko, A. Asenjo, E. M. Gonzalez, J. V. Anguita, M. Vazquez, and J. L. Vicent, Phys. Rev. B 81, 054439 (2010). https://doi.org/10.1103/PhysRevB.81.054439, Google ScholarCrossref
- 47. B. C. Stipe, T. C. Strand, C. C. Poon, H. Balamane, T. D. Boone, J. A. Katine, J.-L. Li, V. Rawat, H. Nemoto, A. Hirotsune, O. Hellwig, R. Ruiz, E. Dobisz, D. S. Kercher, N. Robertson, T. R. Albrecht, and B. D. Terris, Nat. Photonics 4, 484 (2010). https://doi.org/10.1038/nphoton.2010.90, Google ScholarCrossref
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