ABSTRACT
The optical properties of InGaN/GaN core-shell microrods are studied by time-resolved cathodoluminescence. Probing the carrier dynamics along the length of the rod from 4 to 300 K enables us to decompose radiative (τr) and non-radiative (τnr) lifetimes. At 300 K, τnr decreases from 500 at the bottom of the rod to 150 ps at its top. This variation results from an increased In-content in the upper part of the rod that causes a higher density of point defects. We further observe that thanks to the use of nonpolar m-plane growth, τr remains below 1.5 ns up to room temperature even with a thick active layer, which is promising for pushing the onset of the efficiency droop to higher current densities.
This paper was financially supported by the Swiss National Science Foundation under Project Nos. 153620 and 154853 and by the EPFL fellowship program co-funded by FP7 Marie Curie Grant Agreement No. 291771. The authors acknowledge Nicolas Grandjean for his constructive advice on this study.
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