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Published Online: 20 December 2016
Accepted: November 2016

Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm

Review of Scientific Instruments 87, 123106 (2016); https://doi.org/10.1063/1.4971421
Thanh Hung Dinh1,2,a), Yoshiki Kondo1, Toshiki Tamura1, Yuichi Ono1, Hiroyuki Hara1, Hiroki Oikawa1, Yoichi Yamamoto2, Masahiko Ishino2, Masaharu Nishikino2, Tetsuya Makimura3, Padraig Dunne4, Gerry O’Sullivan4, Shigeru Ohta5, Ken Kitano5, Takeo Ejima6, Tadashi Hatano6, and Takeshi Higashiguchi1,b)
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  • Correction: Review of Scientific Instruments 88, 029902 (2017)
    • ABSTRACT
    A flat-field grazing incidence spectrometer operating on the spectral region from 1 to 10 nm was built for research on physics of high temperature and high energy density plasmas. It consists of a flat-field grating with 2400 lines/mm as a dispersing element and an x-ray charged coupled device (CCD) camera as the detector. The diffraction efficiency of the grating and the sensitivity of the CCD camera were directly measured by use of synchrotron radiation at the BL-11D beamline of the Photon Factory (PF). The influence of contamination to the spectrometer also was characterized. This result enables us to evaluate the absolute number of photons in a wide range wavelength between 1 and 10 nm within an acquisition. We obtained absolutely calibrated spectra from highly charged ion plasmas of Gd, from which a maximum energy conversion efficiency of 0.26% was observed at a Nd:YAG laser intensity of 3 × 1012 W/cm2.

    Acknowledgments

    This work was performed under the auspices of MEXT (Ministry of Education, Culture, Sports, Science and Technology, Japan) and “Project for Bio-Imaging and Sensing at Utsunomiya University” from MEXT and was performed under the Cooperative Research Program of “Network Joint Research Center for Materials and Devices” (under Contract Subject No. 2015209) and IMRAM, Tohoku University, Heisei 27 nendo Grant. One of the authors (T.H.D.) also acknowledges support from Grant-in-Aid for Young Scientists B (Grant No. 15K18045) and JSPS Postdoctoral Fellowship for Overseas Researchers (Grant No. P16019). Measurements of the grating efficiency and the response of the x-ray CCD camera were performed under the approval of the Photon Factory Program Advisory Committee (Proposal No. 2015G667). One of the authors (T.H.) also acknowledges support from The Canon Foundation, Research Grant (Basic Research) on TEPCO Memorial Foundation. The UCD group was supported by Science Foundation Ireland International Co-operation Strategic Award No. 13/ISCA/2846.

    REFERENCES
    Section:
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    1. 1. A. Sakdinawat and A. David, Nat. Photonics 4, 796 (2010). https://doi.org/10.1038/nphoton.2010.267, Google ScholarCrossref
    2. 2. P. A. C. Takman, H. Stollberg, G. A. Johansson, A. Holmberg, M. Lindblom, and M. Hertz, J. Microsc. 226, 175 (2007). https://doi.org/10.1111/j.1365-2818.2007.01765.x, Google ScholarCrossref
    3. 3. R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, Phys. Rev. Lett. 99, 098103 (2007). https://doi.org/10.1103/PhysRevLett.99.098103, Google ScholarCrossref
    4. 4. C. Peth, F. Barkusky, and K. Mann, J. Phys. D: Appl. Phys. 41, 105202 (2008). https://doi.org/10.1088/0022-3727/41/10/105202, Google ScholarCrossref
    5. 5. H. Ohashi, T. Higashiguchi, Y. Suzuki, G. Arai, Y. Otani, T. Yatagai, B. Li, P. Dunne, G. O’Sullivan, W. Jiang, A. Endo, H. A. Sakaue, D. Kato, I. Murakami, N. Tamura, S. Sudo, F. Koike, and C. Suzuki, Appl. Phys. Lett. 104, 234107 (2014). https://doi.org/10.1063/1.4883475, Google ScholarScitation, ISI
    6. 6. T. H. Dinh, Y. Suzuki, G. Arai, B. Li, P. Dunne, G. O’Sullivan, S. Fujioka, N. Hasegawa, T. Kawachi, M. Nishikino, and T. Higashiguchi, Appl. Phys. Lett. 107, 121101 (2015). https://doi.org/10.1063/1.4931497, Google ScholarScitation
    7. 7. C. Wagner and N. Harned, Nat. Photonics 4, 24 (2010). https://doi.org/10.1038/nphoton.2009.251, Google ScholarCrossref
    8. 8. V. Y. Banine, K. N. Koshelev, and G. H. P. M. Swinkls, J. Phys. D: Appl. Phys. 44, 253001 (2011). https://doi.org/10.1088/0022-3727/44/25/253001, Google ScholarCrossref
    9. 9. H. Mizoguchi, H. Nakarai, T. Abe, K. M. Nowak, Y. Kawasuji, H. Tanaka, Y. Watanabe, T. Hori, T. Kodama, Y. Shiraishi, T. Yanagida, G. Soumagne, T. Yamada, T. Yamazaki, S. Okazaki, and T. Saitou, Proc. SPIE 9422, 94220C (2015). https://doi.org/10.1117/12.2086347, Google ScholarCrossref
    10. 10. A. A. Schafgans, D. J. Brown, I. V. Fomenkov, R. Sandstrom, A. Ershov, G. Vaschenko, R. Rafac, M. Purvis, S. Rokitski, Y. Tao, D. J. Riggs, W. J. Dunstan, M. Graham, N. R. Farrar, D. C. Brandt, N. Böwering, A. Pirati, N. Harned, C. Wagner, H. Meiling, and R. Kool, Proc. SPIE 9422, 94220B (2015). https://doi.org/10.1117/12.2087421, Google ScholarCrossref
    11. 11. Y. Platonov, J. Rodriguez, M. Kries, E. Louis, T. Feigl, and S. Yulin, in Proceedings of 2011 International Workshop on EUV Lithography, Maui, Hawaii, 13–17 June 2011. Google Scholar
    12. 12. E. Louis, I. Makhotkin, E. Zoethout, and S. Müllender, in Proceedings of 2011 International Workshop on EUV and Soft X-ray Sources, UCD, Dublin, Ireland, 7–10 November 2011. Google Scholar
    13. 13. S. S. Churilov, R. R. Kildiyarova, A. N. Ryabtsev, and S. V. Sadovsky, Phys. Scr. 80, 045303 (2009). https://doi.org/10.1088/0031-8949/80/04/045303, Google ScholarCrossref
    14. 14. T. Otsuka, D. Kilbane, J. White, T. Higashiguchi, N. Yugami, T. Yatagai, W. Jiang, A. Endo, P. Dunne, and G. O’Sullivan, Appl. Phys. Lett. 97, 111503 (2010). https://doi.org/10.1063/1.3490704, Google ScholarScitation, ISI
    15. 15. M. Masnavi, J. Szilagyi, H. Parchamy, and M. C. Richardson, Appl. Phys. Lett. 102, 164102 (2013). https://doi.org/10.1063/1.4802789, Google ScholarScitation, ISI
    16. 16. T. Higashiguchi, T. Otsuka, N. Yugami, W. Jiang, A. Endo, B. Li, P. Dunne, and G. O’Sullivan, Appl. Phys. Lett. 100, 014103 (2012). https://doi.org/10.1063/1.3673912, Google ScholarScitation, ISI
    17. 17. R. J. Fonck, A. T. Ramsey, and R. V. Yelle, Appl. Opt. 21, 2115 (1982). https://doi.org/10.1364/AO.21.002115, Google ScholarCrossref
    18. 18. T. Kita, T. Harada, N. Nakano, and H. Kuroda, Appl. Opt. 22, 512 (1983). https://doi.org/10.1364/AO.22.000512, Google ScholarCrossref
    19. 19. M. C. Hettrick, J. H. Underwood, P. J. Batson, and M. J. Eckart, Appl. Opt. 27, 200 (1988). https://doi.org/10.1364/AO.27.000200, Google ScholarCrossref
    20. 20. T. Yamazaki, E. Gullikson, N. Miyata, M. Koike, Y. Harada, S. Mrowka, U. Kleineberg, J. H. Underwood, M. Yanagihara, and K. Sano, Appl. Opt. 38, 4001 (1999). https://doi.org/10.1364/AO.38.004001, Google ScholarCrossref
    21. 21. M. Koike, K. Sano, E. Gullikson, Y. Harada, and H. Kumata, Rev. Sci. Instrum. 74, 1156 (2003). https://doi.org/10.1063/1.1533097, Google ScholarScitation
    22. 22. A. Saemann and K. Eidmann, Rev. Sci. Instrum. 69, 1949 (1998). https://doi.org/10.1063/1.1148878, Google ScholarScitation
    23. 23. J. Park, G. V. Brown, M. B. Schneider, H. A. Baldis, P. Beiersdorfer, K. V. Cone, R. L. Kelley, C. A. Kilbourne, E. W. Magee, M. J. May, and F. S. Porter, Rev. Sci. Instrum. 81, 10E319 (2010). https://doi.org/10.1063/1.3495790, Google ScholarScitation, ISI
    24. 24. T. Hatano and S. Aihara, J. Phys.: Conf. Ser. 425, 152018 (2013). https://doi.org/10.1088/1742-6596/425/15/152018, Google ScholarCrossref
    25. 25. T. Hatano, S. Aihara, K. Uchida, and T. Tsuru, J. Phys.: Conf. Ser. 463, 012010 (2013). https://doi.org/10.1088/1742-6596/463/1/012010, Google ScholarCrossref
    26. 26. T. Hatano and T. Harada, J. Electron Spectrosc. Relat. Phenom. 196, 156 (2014). https://doi.org/10.1016/j.elspec.2014.05.002, Google ScholarCrossref
    27. 27. Y. Li, G. D. Tsakiris, and R. Sigel, Rev. Sci. Instrum. 66, 80 (1995). https://doi.org/10.1063/1.1146228, Google ScholarScitation
    28. 28. L. Poletto, A. Boscolo, and G. Tondello, Appl. Opt. 38, 29 (1999). https://doi.org/10.1364/AO.38.000029, Google ScholarCrossref
    29. 29. D. Colombant and G. F. Tonon, J. Appl. Phys. 44, 3524 (1973). https://doi.org/10.1063/1.1662796, Google ScholarScitation, ISI
    30. 30. T. Higashiguchi, B. Li, Y. Suzuki, M. Kawasaki, H. Ohashi, S. Torii, D. Nakamura, A. Takahashi, T. Okada, W. Jiang, T. Miura, A. Endo, P. Dunne, G. O’Sullivan, and T. Makimura, Opt. Express 21, 31837 (2013). https://doi.org/10.1364/OE.21.031837, Google ScholarCrossref
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