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Published Online: 29 November 2012
Accepted: October 2012
Journal of Applied Physics 112, 103112 (2012); https://doi.org/10.1063/1.4768163
We have studied multi-section InGaN multiple-quantum-well (MQW) laser diodes grown on c-plane freestanding GaN substrate consisting of an absorber section (AS) and an amplifier gain section. As a result of the interplay between external bias applied to the AS and the internal piezoelectric and spontaneous polarization fields inherent to c-plane InGaN MQWs, the devices exhibit non-linear non-monotonic variations of the threshold current due to the quantum-confined Stark effect that takes place in the AS MQWs. We report on how this effect tailors the lasing characteristics and lasing dynamics, leading from a steady-state cw lasing regime for an unbiased AS to self-pulsation and Q-switching regimes at high negative absorber bias.
The present work was supported by the NCCR Quantum Photonics program of the Swiss National Science Foundation and by the EC Seventh Framework Programme FP7/2007-2013 under the Grant Agreement No. 238556 (FEMTOBLUE). The authors would like to thank Dr. Raphaël Butté for careful reading of the manuscript.
  1. 1. U. Keller, Nature (London) 424, 831 (2003). https://doi.org/10.1038/nature01938 , Google ScholarCrossref
  2. 2. E. Walker, A. Dvornikov, K. Coblentz, and P. Rentzepis, Appl. Opt. 47, 4133 (2008). https://doi.org/10.1364/AO.47.004133 , Google ScholarCrossref
  3. 3. D. Ueda, K. Saito, T. Iwamura, Y. Takemoto, H. Yamatsu, T. Horigome, M. Oyamada, K. Hayashi, N. Tanabe, H. Miyamoto, A. Nakaoki, J. Horigome, H. Uchiyama, K. Yun, and S. Kobayashi, Jpn. J. Appl. Phys., Part 1 50, 032704 (2011). https://doi.org/10.1143/JJAP.50.032704 , Google ScholarCrossref
  4. 4. S.-H. Park, D.-Y. Yang, and K.-S. Lee, Laser Photonics Rev. 3, 1 (2009). https://doi.org/10.1002/lpor.200810027 , Google ScholarCrossref
  5. 5. J. M. Schmitt, IEEE J. Sel. Top. Quantum Electron. 5, 1205 (1999). https://doi.org/10.1109/2944.796348 , Google ScholarCrossref
  6. 6. S. Sanders, L. Eng, J. Paslaski, and A. Yariv, Appl. Phys. Lett. 56, 310 (1990). https://doi.org/10.1063/1.103187 , Google ScholarScitation
  7. 7. M. Kneissl, T. L. Paoli, P. Kiesel, D. W. Treat, M. Teepe, N. Miyashita, and N. M. Johnson, Appl. Phys. Lett. 80, 3283 (2002). https://doi.org/10.1063/1.1477270 , Google ScholarScitation
  8. 8. H. Watanabe, T. Miyajima, M. Kuramoto, M. Ikeda, and H. Yokoyama, Appl. Phys. Express 3, 052701 (2010). https://doi.org/10.1143/APEX.3.052701 , Google ScholarCrossref
  9. 9. K. Saito, H. Watanabe, T. Miyajima, M. Ikeda, and H. Yokoyama, Appl. Phys. Lett. 96, 031112 (2010). https://doi.org/10.1063/1.3292025 , Google ScholarScitation
  10. 10. T. Oki, K. Saito, H. Watanabe, T. Miyajima, M. Kuramoto, M. Ikeda, and H. Yokoyama, Appl. Phys. Express 3, 032104 (2010). https://doi.org/10.1143/APEX.3.032104 , Google ScholarCrossref
  11. 11. J. Palaski and K. Y. Lau, Appl. Phys. Lett. 59, 7 (1991). https://doi.org/10.1063/1.105529 , Google ScholarScitation
  12. 12. K. Yvind, P. M. W. Skovgaard, J. Mork, J. Hanberg, and M. Kroh, Phys. Scr. T101, 129 (2002). https://doi.org/10.1238/Physica.Topical.101a00129 , Google ScholarCrossref
  13. 13. F. R. Ahmad and F. Rana, IEEE Photon. Technol. Lett. 20, 190 (2008). https://doi.org/10.1109/LPT.2007.913254 , Google ScholarCrossref
  14. 14. S. F. Chichibu, A. C. Abare, M. S. Minsky, S. Keller, S. B. Fleischer, J. E. Bowers, E. Hu, U. K. Mishra, L. A. Coldren, S. P. DenBaars, and T. Sota, Appl. Phys. Lett. 73, 2006 (1998). https://doi.org/10.1063/1.122350 , Google ScholarScitation, ISI
  15. 15. J. Dorsaz, A. Castiglia, G. Cosendey, E. Feltin, M. Rossetti, M. Duelk, C. Velez, J.-F. Carlin, and N. Grandjean, Appl. Phys. Express 3, 092102 (2010). https://doi.org/10.1143/APEX.3.092102 , Google ScholarCrossref
  16. 16. G. Arnold and K. Petermann, Opt. Quantum Electron. 10, 311 (1978). https://doi.org/10.1007/BF00620119 , Google ScholarCrossref
  17. 17. J. Dorsaz, D. L. Boïko, L. Sulmoni, J.-F. Carlin, W. G. Scheibenzuber, U. T. Schwarz, and N. Grandjean, Appl. Phys. Lett. 98, 191115 (2011). https://doi.org/10.1063/1.3591977 , Google ScholarScitation, ISI
  18. 18. T. Fleischmann, J. M. Ulloa, M. Moran, G. J. Rees, J. Woodhead, and M. Hopkinson, Microelectron. J. 33, 547 (2002). https://doi.org/10.1016/S0026-2692(02)00017-4 , Google ScholarCrossref
  19. 19. F. Bernardini, V. Fiorentini, and D. Vanderbilt, Phys. Rev. B 56, R10024 (1997). https://doi.org/10.1103/PhysRevB.56.R10024 , Google ScholarCrossref
  20. 20. F. Bernardini, V. Fiorentini, and D. Vanderbilt, Phys. Rev. Lett. 79, 3958 (1997). https://doi.org/10.1103/PhysRevLett.79.3958 , Google ScholarCrossref
  21. 21. V. Fiorentini, F. Bernardini, and O. Ambacher, Appl. Phys. Lett. 80, 1204 (2002). https://doi.org/10.1063/1.1448668 , Google ScholarScitation, ISI
  22. 22. R. Butté and N. Grandjean, Polarization Effects in Semiconductors: From Ab Initio Theory to Device Application, edited by C. Wood and D. Jena (Springer, Berlin, 2009). Google Scholar
  23. 23. W. G. Scheibenzuber, U. T. Schwarz, L. Sulmoni, J.-F. Carlin, A. Castiglia, and N. Grandjean, Appl. Phys. Lett 97, 181103 (2010). https://doi.org/10.1063/1.3514232 , Google ScholarScitation
  24. 24. B. Hakki and T. Paoli, J. Appl. Phys. 44, 4113 (1973). https://doi.org/10.1063/1.1662905 , Google ScholarScitation, ISI
  25. 25. Sample A exhibits a quite different behaviour. The output power in the lasing regime is strongly reduced for flat-band bias (VMIN = −10 V) compared to smaller reverse bias [Fig. 1(c)]. This is the result of fast carrier tunnelling induced by strongly reverse-biased barriers. Thus, the carrier density in the absorber cannot sufficiently rise up to reach the gain regime reducing thereby the slope efficiency [e.g., VAS = −7 V and VAS = −10 V in Fig. 1(c)].
  26. 26. The maximum of the output power under flat-band conditions shifts towards larger negative biases with increasing pump current IGS (see the evolution of the dashed-dotted lines in Fig. 6(b)). This slight shift can be explained by partial screening of the built-in potential Vbi due to photogenerated carriers in the reverse-biased absorber. Therefore, a higher external bias VAS is needed to reach the flat-band conditions [see Eq. (1)].
  27. 27. W. G. Scheibenzuber, C. Hornuss, U. T. Schwarz, L. Sulmoni, J. Dorsaz, J.-F. Carlin, and N. Grandjean, Appl. Phys. Express 4, 062702 (2011). https://doi.org/10.1143/APEX.4.062702 , Google ScholarCrossref
  28. 28. C. R. Mirasso, G. H. M. Van Tartwijk, E. Hernandez-Garcia, D. Lenstra, S. Lynch, P. Landais, P. Phelan, J. O'Gorman, M. San Miguel, and W. Elsasser, IEEE J. Quantum Electron. 35, 764 (1999). https://doi.org/10.1109/3.760324 , Google ScholarCrossref
  29. 29. K. Petermann, Laser Diode Modulation and Noise (Kluwer Academic, Dordrecht, 1991). Google Scholar
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