MENU
  • Scitation Home
SUBMIT YOUR ARTICLE

Thank you

For your interest in the Applied Physics Letters

Check for updates on crossmark
Prev Next
No Access
Published Online: 27 June 2012
Accepted: June 2012

Investigation of electronic trap states in organic photovoltaic materials by current-based deep level transient spectroscopy

Appl. Phys. Lett. 100, 263304 (2012); https://doi.org/10.1063/1.4731637
Stefan Neugebauer1, Julia Rauh1, a), Carsten Deibel1, and Vladimir Dyakonov1,2, b)
more...View Affiliations
  • Original article: APL: Organic Electronics and Photonics 5 (6), 137 (2012)
    • ABSTRACT
    Current-based deep level transient spectroscopy was used to study trap states in poly(3-hexylthiophene-2,5-diyl) (P3HT), [6,6]-phenyl-C61 butyric acid methyl ester (PCBM), and P3HT:PCBM blend. The obtained spectra showed traps of 87 meV activation energy in pure P3HT and 21 meV for PCBM. The blend shows a complex emission rate spectrum consisting of several different emission rate bands in the range of 0.1–30 s−1, yielding activation energies between about 30 meV and 160 meV.
    The current work is supported by the Bundesministerium für Bildung und Forschung in the framework of the OPV Stability Project (Contract No. 03SF0334F). C.D. gratefully acknowledges the support of the Bavarian Academy of Sciences and Humanities. V.D.’s work at the ZAE Bayern is financed by the Bavarian Ministry of Economic Affairs, Infrastructure, Transport and Technology.

    REFERENCES
    Section:
    Previous sectionNext section

    1. 1. M. A. Green, K. Emery, Y. Hishikawa, W. Warta, and D. E. Dunlop, Prog. Photovoltaics 20, 12 (2012). https://doi.org/10.1002/pip.2163 , Google ScholarCrossref
    2. 2. C. Deibel and V. Dyakonov, Rep. Prog. Phys. 73, 096401 (2010). https://doi.org/10.1088/0034-4885/73/9/096401 , Google ScholarCrossref
    3. 3. O. Gaudin, R. B. Jackman, T.-P. Nguyen, and P. Le Rendu, J. Appl. Phys. 90, 4196 (2001). https://doi.org/10.1063/1.1403669 , Google ScholarScitation
    4. 4. T. P. Nguyen, P. Le Rendu, O. Gaudin, A. J. T. Lee, R. B. Jackman, and C. H. Huang, Thin Solid Films 511–512, 338 (2006). https://doi.org/10.1016/j.tsf.2005.12.033 , Google ScholarCrossref
    5. 5. G. W. Jones, D. M. Taylor, and H. L. Gomes, Synth. Met. 85, 1341 (1997). https://doi.org/10.1016/S0379-6779(97)80262-7 , Google ScholarCrossref
    6. 6. A. Miller and E. Abrahams, Phys. Rev. 120, 745 (1960). https://doi.org/10.1103/PhysRev.120.745 , Google ScholarCrossref
    7. 7. M. Grünewald and P. Thomas, Phys. Stat. Sol. B 94, 125 (1979). https://doi.org/10.1002/pssb.2220940113 , Google ScholarCrossref
    8. 8. R. Schmechel, J. Appl. Phys. 93, 4653 (2003). https://doi.org/10.1063/1.1560571 , Google ScholarScitation, ISI
    9. 9. V. I. Arkhipov, E. V. Emelianova, and G. J. Adriaenssens, Phys. Rev. B 64, 125125 (2001). https://doi.org/10.1103/PhysRevB.64.125125 , Google ScholarCrossref
    10. 10. D. V. Lang, J. Appl. Phys. 45, 3023 (1974). https://doi.org/10.1063/1.1663719 , Google ScholarScitation, ISI
    11. 11. B. M. Arora, S. Chakravarty, S. Subramanian, V. I. Polyakov, M. G. Ermakov, O. N. Ermakova, and P. I. Perov, J. Appl. Phys. 73, 1802 (1993). https://doi.org/10.1063/1.353189 , Google ScholarScitation
    12. 12. P. Stallinga, H. L. Gomes, H. Rost, A. B. Holmes, M. G. Harrison, and R. H. Friend, Synth. Met. 111, 535 (2000). https://doi.org/10.1016/S0379-6779(99)00413-0 , Google ScholarCrossref
    13. 13. J. Weese, Comput. Phys. Commun. 77, 429 (1993). https://doi.org/10.1016/0010-4655(93)90187-H , Google ScholarCrossref
    14. 14. J. Weese, Comput. Phys. Commun. 69, 99 (1992). https://doi.org/10.1016/0010-4655(92)90132-I , Google ScholarCrossref
    15. 15. I. Thurzo, G. Pham, T. U. Kampen, and D. R. T. Zahn, Thin Solid Films 433, 292 (2003). https://doi.org/10.1016/S0040-6090(03)00301-8 , Google ScholarCrossref
    16. 16. T. P. Nguyen, P. Le Rendu, P. Lévêque, J. Ip, O. Gaudin, and R. B. Jackman, Org. Electron. 5, 53 (2004). https://doi.org/10.1016/j.orgel.2004.02.002 , Google ScholarCrossref
    17. 17. C.-H. Huang, C.-W. Lee, C.-S. Hsu, C. Renaud, and T.-P. Nguyen, Thin Solid Films 515, 7671 (2007). https://doi.org/10.1016/j.tsf.2006.11.095 , Google ScholarCrossref
    18. 18. C. Renaud and T. P. Nguyen, J. Appl. Phys. 104, 113705 (2008). https://doi.org/10.1063/1.3010310 , Google ScholarScitation
    19. 19. A. A. Istratov and O. F. Vyvenko, Rev. Sci. Instrum. 70, 1233 (1999). https://doi.org/10.1063/1.1149581 , Google ScholarScitation, ISI
    20. 20. J. Schafferhans, A. Baumann, A. Wagenpfahl, C. Deibel, and V. Dyakonov, Org. Electron. 11, 1693 (2010). https://doi.org/10.1016/j.orgel.2010.07.016 , Google ScholarCrossref
    21. 21. J. Schafferhans, A. Baumann, C. Deibel, and V. Dyakonov, Appl. Phys. Lett. 93, 93303 (2008). https://doi.org/10.1063/1.2978237 , Google ScholarScitation
    22. 22. J. Schafferhans, C. Deibel, and V. Dyakonov, Adv. Energy Mater. 1, 655 (2011). https://doi.org/10.1002/aenm.201100175 , Google ScholarCrossref
    23. 23. C. G. Shuttle, B. O’Regan, A. M. Ballantyne, J. Nelson, D. D. C. Bradley, J. de Mello, and J. R. Durrant, Appl. Phys. Lett. 92, 93311 (2008). https://doi.org/10.1063/1.2891871 , Google ScholarScitation
    24. 24. C. G. Shuttle, A. Maurano, R. Hamilton, B. O’Regan, J. C. de Mello, and J. R. Durrant, Appl. Phys. Lett. 93, 183501 (2008). https://doi.org/10.1063/1.3006316 , Google ScholarScitation, ISI
    25. 25. G. Juška, K. Genevičius, N. Nekrašas, G. Sliaužys, and G. Dennler, Appl. Phys. Lett. 93, 143303 (2008). https://doi.org/10.1063/1.2996588 , Google ScholarScitation
    26. 26. A. Foertig, A. Baumann, D. Rauh, V. Dyakonov, and C. Deibel, Appl. Phys. Lett. 95, 052104 (2009). https://doi.org/10.1063/1.3202389 , Google ScholarScitation
    1. © 2012 American Institute of Physics.

    Article Metrics

    Views
    303
    Citations
    Crossref 26
    Web of Science
    ISI 26

    Altmetric

    Please Note: The number of views represents the full text views from December 2016 to date. Article views prior to December 2016 are not included.