ABSTRACT
The trap distribution in the conjugated polymer poly(3-hexylthiophene) was investigated by fractional thermally stimulated current measurements. Two defect states with activation energies of about 50 and 105 meV and Gaussian energy distributions were revealed. The first is assigned to the tail of the intrinsic density of states, whereas the concentration of the second trap is directly related to oxygen exposure. The impact of the oxygen induced traps on the charge transport was examined by performing photo-induced charge carrier extraction by linearly increasing voltage measurements that exhibited a strong decrease in the mobility with air exposure time.
- 1. A. Kadashchuk, A. Vakhnin, Y. Skryshevski, V. Arkhipov, E. Emelianova, and H. Bässler, Chem. Phys. https://doi.org/10.1016/S0301-0104(03)00227-1 291, 243 (2003). Google ScholarCrossref
- 2. G. Juška, K. Arlauskas, M. Viliūnas, and J. Kočka, Phys. Rev. Lett. https://doi.org/10.1103/PhysRevLett.84.4946 84, 4946 (2000). Google ScholarCrossref
- 3. G. Juška, K. Genevičius, R. Österbacka, K. Arlauskas, T. Kreouzis, D. D. C. Bradley, and H. Stubb, Phys. Rev. B https://doi.org/10.1103/PhysRevB.67.081201 67, 081201 (2003). Google ScholarCrossref
- 4. V. R. Nikitenko, H. Heil, and H. von Seggern, J. Appl. Phys. https://doi.org/10.1063/1.1595707 94, 2480 (2003). Google ScholarScitation
- 5. R. Schmechel and H. von Seggern, Phys. Status Solidi A https://doi.org/10.1002/pssa.200404343 201, 1215 (2004). Google ScholarCrossref
- 6. J. Steiger, R. Schmechel, and H. von Seggern, Synth. Met. https://doi.org/10.1016/S0379-6779(02)00012-7 129, 1 (2002). Google ScholarCrossref
- 7. A. Kadashchuk, N. Ostapenok, V. Zaika, and S. Nespurek, Chem. Phys. https://doi.org/10.1016/S0301-0104(98)00167-0 234, 285 (1998). Google ScholarCrossref
- 8. A. Kadashchuk, D. S. Weiss, P. M. Borsenberger, S. Nespurek, N. Ostapenko, and V. Zaika, Chem. Phys. https://doi.org/10.1016/S0301-0104(99)00169-X 247, 307 (1999). Google ScholarCrossref
- 9. A. Kadashchuk, Y. Skryshevski, Y. Piryatinski, A. Vakhnin, E. Emelianova, V. Arkhipov, H. Bässler, and J. Shinar, J. Appl. Phys. https://doi.org/10.1063/1.1464235 91, 5016 (2002). Google ScholarScitation
- 10. A. Kadashchuk, R. Schmechel, H. von Seggern, U. Scherf, and A. Vakhnin, J. Appl. Phys. https://doi.org/10.1063/1.1953870 98, 024101 (2005). Google ScholarScitation
- 11. N. von Malm, J. Steiger, H. Heil, R. Schmechel, and H. von Seggern, J. Appl. Phys. https://doi.org/10.1063/1.1522489 92, 7564 (2002). Google ScholarScitation
- 12. C. Tanase, E. J. Meijer, P. W. M. Blom, and D. M. de Leeuw, Phys. Rev. Lett. https://doi.org/10.1103/PhysRevLett.91.216601 91, 216601 (2003). Google ScholarCrossref
Please Note: The number of views represents the full text views from December 2016 to date. Article views prior to December 2016 are not included.
