ABSTRACT
A technique is described for mounting a single vapor‐grown whisker on the point of an otherwise ordinary field‐emission tip assembly with sufficient bond strength to permit both field‐electron and field‐ion microscopy. Field‐electron emission patterns are shown for clean Au and Pt whisker surfaces. Hydrogen field‐ion images of thermally cleaned Pt whisker surfaces and helium field‐ion images of field‐evaporated Pt whisker surfaces are shown. Imperfections in central {011} planes are sometimes found, but there is no strong evidence that these are axial screw dislocations.
- 1. R. Gomer, J. Chem. Phys. 28, 457 (1958). Google ScholarScitation
- 2. A. J. Melmed and R. Gomer, J. Chem. Phys. 34, 1802 (1961). Google ScholarScitation
- 3. E. W. Muller, Advan. Electron. Electron Phys. 13, 83, 1960. Google ScholarCrossref
- 4. Allan J. Melmed, J. Chem. Phys. 36, 1101 (1962). Google ScholarScitation
- 5. For a discussion of screw dislocations in growing crystals, see W. K. Burton, N. Cabrera, and F. C. Frank, Phil. Trans. Roy. Soc. (London) A243, 299 (1951). Google ScholarCrossref
- 6. A. P. Komar, V. P. Savchenko, and V. N. Shrednik, Radiotekh. i Elektron. 5, 226 (1960). Google Scholar
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