ABSTRACT
In our study, III-nitride laser diodes with uncoated facets obtained by cleavage show a much faster degradation than coated ones. An increase in threshold current and drop of slope efficiency suggest increased absorption losses. Degradation experiments in different atmospheres prove the influence of the respective atmosphere and indicate the growth of an oxide film leading to increased absorption. Because the observed degradation is insensitive to the photon density we suggest nonradiative centers, which are saturated at low photon densities, to be at the origin of degradation. No evidence for photon enhanced degradation of coated laser diodes was found. A dielectric coating efficiently protects the facets.
- 1. M. Ikedaand S. Uchida, Phys. Status Solidi A 194, 407 (2002). Google ScholarCrossref
- 2. T. Mukai, S. Nagahama, T. Yanamoto, and M. Sano, Phys. Status Solidi A 194, 261 (2002). Google ScholarCrossref
- 3. S. Bader, B. Hahn, H.-J. Lugauer, A. Lell, A. Weimar, G. Brüderl, J. Baur, D. Eisert, M. Scheubeck, S. Heppel, A. Hangleiter, and V. Härle, Phys. Status Solidi A 180, 177 (2000). Google ScholarCrossref
- 4. V. Kümmler, G. Brüderl, S. Bader, S. Miller, A. Weimar, A. Lell, V. Härle, U. T. Schwarz, N. Gmeinwieser, and W. Wegscheider, Phys. Status Solidi A 194, 419 (2002). Google ScholarCrossref
- 5. M. Fukuda, Reliability and Degradation of Semiconductor Lasers and LEDs (Artech House, Norwood, 1991). Google Scholar
- 6. K. Itaya, M. Ishikawa, H. Okuda, Y. Watanabe, and K. Nitta, Appl. Phys. Lett. 53, 1363 (1988). Google ScholarScitation
- 7. I. Ladany, M. Ettenberg, H. F. Lockwood, and H. Kressel, Appl. Phys. Lett. 30, 87 (1977). Google ScholarScitation
- 8. J. Schalwig, G. Müller, I. Karrer, M. Eickhoff, O. Ambacher, M. Stutzmann, L. Görgens, and G. Dollinger, Appl. Phys. Lett. 80, 1222 (2002). Google ScholarScitation
- 9. G. Steinhoff, M. Hermann, W. J. Schaff, L. F. Eastman, M. Stutzmann, and M. Eickhoff, Appl. Phys. Lett. 83, 177 (2003). Google ScholarScitation
- 10. C. H. Henry, P. M. Petroff, R. A. Logan, and F. R. Merritt, J. Appl. Phys. 50, 3721 (1979). Google ScholarScitation
- 11. M. Fukudaand K. Takahei, J. Appl. Phys. 57, 129 (1985). Google ScholarScitation
- 12. M. Okayasu, M. Fukuda, T. Tatsuya, S. Uehara, and K. Kurumada, J. Appl. Phys. 69, 8346 (1991). Google ScholarScitation
- 13. M. Fukuda, M. Okayasu, T. Takeshita, and M. Wada, Quality and Reliability Eng. Int. 8, 238 (1992). Google ScholarCrossref
Please Note: The number of views represents the full text views from December 2016 to date. Article views prior to December 2016 are not included.

